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Integrity report for Deep Learning Regression of VLSI Plasma Etch Metrology

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1910.10067 · pith:2019:GLEFXA4U2JW2ZAPLFK7XQLDCSS

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Paper page arXiv integrity.json bundle.json

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Signed record

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