Integrity report for Compact and explicit physical model for lateral metal-oxide-semiconductor field-effect transistor with nanoelectromechanical system based resonant gate

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1001.2148 · pith:2010:HBJNGWGORKB2AMH4TSJBF6WW4U

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

Signed record

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