Integrity report for Defect Control via Cu Enrichment Enhances Multifunctional Properties in the Polar Semiconductor Cu1+xMn1-ySiTe3

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.18584 · pith:2026:HD5R6WB3QPJESUBXMELNSVUG2G

0Critical

0Advisory

5Detectors run

2026-05-22Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

doi_title_agreement completed v1.0.0 · findings 0 · 2026-05-22 09:31:55.338140+00:00

doi_compliance completed v1.0.0 · findings 0 · 2026-05-22 09:25:01.268686+00:00

claim_evidence completed v1.0.0 · findings 0 · 2026-05-22 00:42:38.157552+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-21 21:22:43.505913+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-20 00:33:33.391592+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/HD5R6WB3/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.