Paper Citation Record · LEDGER

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

As of 14 August 2026, this Paper Citation Record lists 50 of 50 outbound references and 2 inbound Pith citation observations for arXiv:2606.22366.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2606.22366 v2

Coverage vector

measured 50 of 50 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-07-11T11:50:26.030339Z

measured 52 of 52 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-13T06:32:02.005865+00:00

measured 2 of 2 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-07-11T11:50:26.030339Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: pith, observed 2026-07-10T12:15:01.137692Z

Reference resolution

50 of 50 outbound references displayed

verified exact2
verified fuzzy0
unresolved46
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External citation measurements

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Outbound references

Observation c58acf2f-a132-42ee-b9fd-bbd002ddde69 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 1

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation b0c8069e-3649-4dec-90cb-4449b190739b · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 2

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation 9019bec1-2f69-4471-9ff0-823d99123e25 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 3

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation 6973a8b2-a70b-46ff-8b6d-14a5df134afe · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 4

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation e5b1650c-7959-485b-9548-5fabf7d2cdad · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 5

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation 036d4915-234a-4033-a173-e22034cc5b3f · outbound

This paper cites Alignment-Free Nanometric Optical Metrology Enabled by Structured Light.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 6

Resolution: malformed identifier; local_arxiv, observed 2026-06-26T10:29:18.800639Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 41d189a1-ef31-4318-8e1e-9aee5dac5c9e · outbound

This paper cites Optical metrology: the long and unstoppable way to become an outstanding measuring tool,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical metrology: the long and unstoppable way to become an outstanding measuring tool,

Reference 7

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4d09fc0c-00c3-406e-84d8-60d87ce429b6 · outbound

This paper cites Recent advances in traceable nanoscale dimension and force metrology in the UK,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Recent advances in traceable nanoscale dimension and force metrology in the UK,

Reference 8

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 90b28e38-26e6-4ec4-a7d4-30f838eded71 · outbound

This paper cites Deep learning in optical metrology: a review,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Deep learning in optical metrology: a review,

Reference 9

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation c1d912cf-3a91-45f2-8be1-6d3db067a19d · outbound

This paper cites Metrology with a twist: probing and sensing with vortex light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Metrology with a twist: probing and sensing with vortex light,

Reference 10

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation f473f9de-f74c-4696-9b7b-8ac5e8235ceb · outbound

This paper cites Alignment-Free Nanometric Optical Metrology Enabled by Structured Light.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Alignment-Free Nanometric Optical Metrology Enabled by Structured Light

Reference 11

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Source-reported events for the cited work

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Observation 2228929c-450f-4912-a470-6bd61c7de16f · outbound

This paper cites Detecting nanometric displacements with optical ruler metrology,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Detecting nanometric displacements with optical ruler metrology,

Reference 12

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation f1ef2c75-9754-4e8e-93ef-1f74dae2e48e · outbound

This paper cites The michelson interferometer,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light The michelson interferometer,

Reference 13

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation ccca3e2f-cda4-413d-ba29-192e6046a37e · outbound

This paper cites A high-speed white-light scanning interferometer for bump inspection of semiconductor manufacture,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light A high-speed white-light scanning interferometer for bump inspection of semiconductor manufacture,

Reference 14

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 794304f7-8f59-4be4-962f-d472a89cb727 · outbound

This paper cites Interferometric observations of rapidly rotating stars,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Interferometric observations of rapidly rotating stars,

Reference 15

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation fb8a9e62-573f-4777-baab-b1d3443f054f · outbound

This paper cites Interferometer techniques for gravitational- wave detection,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Interferometer techniques for gravitational- wave detection,

Reference 16

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation fe712fb2-57e5-4c10-b5c1-f712aff902c1 · outbound

This paper cites an unresolved cited work.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unresolved cited work

Reference 17

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 592c1255-216c-4973-8e90-6988c4151fb4 · outbound

This paper cites Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung,

Reference 18

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation b1d6cc14-0010-4ebf-b043-3d596884e932 · outbound

This paper cites Review of recent developments in stimulated emission depletion microscopy: applications on cell imaging,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Review of recent developments in stimulated emission depletion microscopy: applications on cell imaging,

Reference 19

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation 76230f67-d124-450b-bb53-993bdd13e6f7 · outbound

This paper cites Live-cell photoactivated localization microscopy of nanoscale adhesion dynamics,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Live-cell photoactivated localization microscopy of nanoscale adhesion dynamics,

Reference 20

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation e89d429c-dea6-4f95-8d67-fdc640db4884 · outbound

This paper cites Three-dimensional super-resolution imaging by stochastic optical reconstruction microscopy,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Three-dimensional super-resolution imaging by stochastic optical reconstruction microscopy,

Reference 21

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation dd3f8c73-066d-415c-8317-f8429ba81efd · outbound

This paper cites High-resolution, high-speed 3-d dynamically deformable shape measurement using digital fringe projection techniques,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light High-resolution, high-speed 3-d dynamically deformable shape measurement using digital fringe projection techniques,

Reference 22

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 0d28c325-024b-44a5-aa68-5038600ab6ae · outbound

This paper cites Phase measuring deflectometry: a new approach to measure specular free-form surfaces,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Phase measuring deflectometry: a new approach to measure specular free-form surfaces,

Reference 23

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e1a2e46e-939b-4c99-9f27-94575c6577f2 · outbound

This paper cites Picophotonic localization metrology beyond thermal fluctuations,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Picophotonic localization metrology beyond thermal fluctuations,

Reference 24

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2c8f5ec7-fbe6-4cf4-bfd1-e830cb0171b1 · outbound

This paper cites 3D positional metrology of a virus-like nanoparticle with topologically structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light 3D positional metrology of a virus-like nanoparticle with topologically structured light,

Reference 25

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 599fe624-6017-4c6c-800e-e5854bc13fef · outbound

This paper cites Adaptive Structured‐Light 3D Surface Imaging with Cross‐Domain Learning,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Adaptive Structured‐Light 3D Surface Imaging with Cross‐Domain Learning,

Reference 26

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 49b3267e-9759-45d7-bceb-b9bedfd34cc2 · outbound

This paper cites Retrieving positions of closely packed subwavelength nanoparticles from their diffraction patterns,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Retrieving positions of closely packed subwavelength nanoparticles from their diffraction patterns,

Reference 27

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 35bd8aaa-bd5e-4e7f-9d24-ca1ddf560784 · outbound

This paper cites OpticalNet: An optical imaging dataset and benchmark beyond the diffraction limit,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light OpticalNet: An optical imaging dataset and benchmark beyond the diffraction limit,

Reference 28

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation 76771d79-b846-4e69-aa58-93c1d8140a59 · outbound

This paper cites Unlabeled Far- Field Deeply Subwavelength Topological Microscopy (DSTM),.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Unlabeled Far- Field Deeply Subwavelength Topological Microscopy (DSTM),

Reference 29

Resolution: verified exact; doi, observed 2026-06-26T10:29:18.802400Z

Source-reported events for the cited work

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Observation e9bdae35-f505-47cd-b58e-2e388d5a1016 · outbound

This paper cites 2D Super‐ Resolution Metrology Based on Superoscillatory Light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light 2D Super‐ Resolution Metrology Based on Superoscillatory Light,

Reference 30

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation e0e7f3c2-6a4c-4e35-a533-4771701d70c1 · outbound

This paper cites Optical vortices 30 years on: OAM manipulation from topological charge to multiple singularities,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical vortices 30 years on: OAM manipulation from topological charge to multiple singularities,

Reference 31

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 3340e72f-4809-4111-b44d-82e8303ad0a5 · outbound

This paper cites Structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Structured light,

Reference 32

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 6b7ab6ac-3660-4c26-8f8c-b2c4fbb29ecd · outbound

This paper cites Towards higher-dimensional structured light,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Towards higher-dimensional structured light,

Reference 33

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation cb2dfe22-d8dd-459a-aab9-543a99fd4463 · outbound

This paper cites Nano-optical metrology with phase singularities,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Nano-optical metrology with phase singularities,

Reference 34

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 8c6ac651-6130-4b23-bedb-30e2d1698ddd · outbound

This paper cites Optical superoscillation technologies beyond the diffraction limit,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optical superoscillation technologies beyond the diffraction limit,

Reference 35

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

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Observation 04cfae62-4cd9-4b8b-b48d-d68312bf813c · outbound

This paper cites Multidimensional phase singularities in nanophotonics,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Multidimensional phase singularities in nanophotonics,

Reference 36

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 9cf46204-3956-4978-89c6-37f38e3955ec · outbound

This paper cites Multifunctional binary diffractive optical elements for structured light projectors,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Multifunctional binary diffractive optical elements for structured light projectors,

Reference 37

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e2f06a53-6655-42fd-b5c1-f6dfab362699 · outbound

This paper cites Metasurface-driven full-space structured light for three-dimensional imaging,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Metasurface-driven full-space structured light for three-dimensional imaging,

Reference 38

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e521afd9-cdbe-47b4-98a6-17f60db069da · outbound

This paper cites Structured illumination microscopy using digital micro-mirror device and coherent light source,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Structured illumination microscopy using digital micro-mirror device and coherent light source,

Reference 39

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Unavailable: canonical work link unavailable.

Observation e4c4ed7c-1ad2-45d2-ad55-403443471ecc · outbound

This paper cites What spatial light modulators can do for optical microscopy,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light What spatial light modulators can do for optical microscopy,

Reference 40

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation ab356f04-d7b7-472d-94c9-6fc6c81fada2 · outbound

This paper cites Digitally tailoring arbitrary structured light of generalized ray-wave duality,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Digitally tailoring arbitrary structured light of generalized ray-wave duality,

Reference 41

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0d25c2e9-c2b1-4747-8a4c-1320d5df031e · outbound

This paper cites Deep residual learning for image recognition,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Deep residual learning for image recognition,

Reference 42

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 45569f91-0c94-4246-8bb2-b8bf2ced7772 · outbound

This paper cites Wide Residual Networks.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Wide Residual Networks

Reference 43

Resolution: verified exact; local_arxiv, observed 2026-07-04T09:09:43.703693Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 8d6cfe9f-aad5-455b-be6e-b75ab5e18b0c · outbound

This paper cites Image super-resolution via deep recursive residual network,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Image super-resolution via deep recursive residual network,

Reference 44

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 06294b72-48a2-43ae-a3e2-cb9693da694b · outbound

This paper cites Residual attention network for image classification,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Residual attention network for image classification,

Reference 45

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Observation d6ab5ca0-37b4-4b76-b9d4-e17dacc7dd6b · outbound

This paper cites Background prior-based salient object detection via deep reconstruction residual,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Background prior-based salient object detection via deep reconstruction residual,

Reference 46

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation dbcaebe9-0da0-4c5d-bff5-65481753d3ad · outbound

This paper cites Full-resolution residual networks for semantic segmentation in street scenes,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Full-resolution residual networks for semantic segmentation in street scenes,

Reference 47

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 0a8e18d0-4bbb-449b-bc25-e770732543b6 · outbound

This paper cites A study of the optimization algorithms in deep learning,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light A study of the optimization algorithms in deep learning,

Reference 48

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 76c0a980-fd2b-4a09-9fb3-b851bb005343 · outbound

This paper cites Photonic torons with 3D topology transitions and tunable spin monopoles,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Photonic torons with 3D topology transitions and tunable spin monopoles,

Reference 49

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation bd913318-03e1-4c74-89e6-4e33feb67508 · outbound

This paper cites Optimal beam-displacement measurements using high-order structured light modes,.

Alignment-Free Nanometric Optical Metrology Enabled by Structured Light Optimal beam-displacement measurements using high-order structured light modes,

Reference 50

Resolution: unresolved; no resolver link, observed 2026-06-26T10:23:08.677211Z

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Unavailable: canonical work link unavailable.

Pith citing papers

Observation 036d4915-234a-4033-a173-e22034cc5b3f · inbound