Integrity report for Individual Characterization of Fast-Responding Trap States at the NO-Annealed SiO₂/4H-SiC Interface

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.27041 · pith:2026:IMLOUGTTJT3NWF3ZIUU5IIACHU

0Critical

0Advisory

5Detectors run

2026-05-31Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-05-31 06:26:38.923294+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-27 01:53:35.109600+00:00

citation_quote_validity skipped v0.1.0 · findings 0 · 2026-05-27 01:50:18.603400+00:00

shingle_duplication skipped v0.1.0 · findings 0 · 2026-05-27 01:49:57.974727+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-27 01:34:11.792860+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/IMLOUGTTJT3NWF3ZIUU5IIACHU/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.