Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-07T22:00:58.539689Z
Paper Citation Record · LEDGER
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection
As of 22 August 2026, this Paper Citation Record lists 53 of 53 outbound references and 0 inbound Pith citation observations for arXiv:2502.09308.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-22T06:32:14.747728+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
53 of 53 outbound references displayed
- verified exact0
- verified fuzzy17
- unresolved36
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 4b4469cc-452c-48f2-bda3-3294f51521d5 · outbound
This paper cites & Liu, Z.
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.329273Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 901e6fb7-44d5-445c-8207-0682a6aec635 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 2
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.315037Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation b2fc20cf-2ffa-41bc-b36f-c8fccd2476ef · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 3
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.300614Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation cc57fbeb-0e08-48ef-93f7-0377fe965977 · outbound
This paper cites & Mousavi, A.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection & Mousavi, A
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.285933Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 061739e9-1da8-4d6f-aa27-ac41a4f14963 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 5
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.270837Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 440e5923-b122-410f-bc53-a1030c29303e · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.256774Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 4dd86932-60bf-4ce5-9423-dad03fc56f59 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 7
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.242751Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 122bbfd0-ba4d-460c-8682-c1302fae6e5f · outbound
This paper cites & Verma, P.
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.228506Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation c5944ebf-c1d3-43c4-94fc-7fb35fdf5ae6 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 9
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.214584Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 0c294235-0ae7-49ab-a71b-22b1280674fc · outbound
This paper cites V., Lu, W.
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.200532Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation d8408a63-ff6c-435d-840c-519d2b9993af · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 11
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.186256Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation eaa5c168-8117-4665-942a-fa281f038779 · outbound
This paper cites & Zhang, X.
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.171920Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 20d314af-c071-4486-a2c4-2e267f38fd81 · outbound
This paper cites & Hillenbrand, R.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection & Hillenbrand, R
Reference 13
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.156990Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 3095f523-0f74-46ed-8420-ec15d9c1aa24 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 14
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.142166Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 786f6c46-b3b5-438c-8a2e-b9fdbe2b99fb · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 15
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.128402Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation d90a6a2f-5175-4c09-af60-f4ea8775a01c · outbound
This paper cites & Taubner, T.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection & Taubner, T
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.114309Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation da5fbbf9-3af9-4f48-a8d6-675f4b881e76 · outbound
This paper cites & Zhang, X.
Reference 17
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.099309Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 2f26840a-81d6-4796-a600-f8895df0ea8b · outbound
This paper cites I., Hung, Y.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection I., Hung, Y
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.084412Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation e058b7ef-5c17-4cd3-a7dc-29d42a3300d4 · outbound
This paper cites & Zhang, X.
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.069424Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 3bb92477-6d67-4d03-8278-5c8da1e47b3f · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 20
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.054230Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation e608862e-7181-44e8-b56c-c8dae1024f90 · outbound
This paper cites M., Maier, S.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection M., Maier, S
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:59.039521Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation abfcd182-efd6-4918-981a-ff7ebc5310f6 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 22
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.023398Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 184fb425-1a7d-474e-bde4-b36fdb581965 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 23
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:59.007029Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 2f1912fe-9b4a-41a1-ac92-171ba71ddac8 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 24
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.992461Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 28b8b63e-840b-40cc-a40d-38192d45ea87 · outbound
This paper cites N., Petersen, R., Pedersen, T.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection N., Petersen, R., Pedersen, T
Reference 25
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.978124Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 38f7fb19-9bee-4dda-9d09-530eb241cc92 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 26
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.963753Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 76875fbe-840f-4345-be6f-af0c2c78de6b · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 27
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.948124Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation eabf5d0b-2c7b-4d9d-9795-d53e50da23f2 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 28
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.933943Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 72939872-489a-4bd1-8627-d03cfb6ce82e · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 29
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.919583Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 0829044b-53a1-4e74-b940-408a94999555 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 30
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.905634Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation c2a5d72d-46f1-4270-9330-27c30509a939 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 31
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.891317Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation e377807c-28e2-4d56-b204-e80c9215b02e · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 32
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.877182Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 1e8212d8-bbde-49f8-9100-b2a90a515386 · outbound
This paper cites N., Fogler, M.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection N., Fogler, M
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.862564Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 47c1da6e-bd99-4ccf-a2f6-1f8f95bd9b53 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 34
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.848696Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation c33069e5-371d-453b-8c6c-75d3de6fd09b · outbound
This paper cites J., Martí n-Moreno, L.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection J., Martí n-Moreno, L
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.834488Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 63f05825-a8c9-4300-b195-0047bf32c927 · outbound
This paper cites M., Li, S., Xu, L., Hou, B.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection M., Li, S., Xu, L., Hou, B
Reference 36
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.820946Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 0f3aeb9e-9bae-49fe-843e-5bd99bff12db · outbound
This paper cites A., Simovski, C.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection A., Simovski, C
Reference 37
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.807181Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 2f8be8ad-e494-43c9-a134-bf6697a9567f · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 38
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.793604Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 8f85d9eb-42fa-4565-a61e-3dc317d2575b · outbound
This paper cites W., Yakovlev, A.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection W., Yakovlev, A
Reference 39
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T22:00:58.780012Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 786266d0-65e7-4b00-9421-a23eeb8ce08c · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 40
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.766296Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation f0be9715-334e-4db2-af0a-05f4b6391018 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 41
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.752560Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 8d23579e-7eca-4eea-bace-b34b2ebfaaa9 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 42
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.738487Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 52f2c4e6-d673-4326-9b5a-02fc78013ebb · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 43
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.724376Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 4c92a142-6982-4c10-ba42-ba4f0f26eaa0 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 44
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.709764Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation d0ea79f8-0d5e-4000-a94a-39cbdd7b1955 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 45
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.695814Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation a063979b-94df-40c3-83ce-9852646d5a20 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 46
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.680765Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 99c57537-033d-4b14-a1a2-959f46c9e223 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 47
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.666484Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 87d3c7a2-68c9-4d15-84bc-2104264df0b4 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 48
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.651168Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 7bc38e8f-7101-4186-ad5b-2c71759f7347 · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 49
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.634879Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 00eab838-cfa1-4bb0-a7b2-df87ff12f2fb · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 50
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.619810Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation e74357e3-10c5-45cb-9604-143ab180fa5b · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 51
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.605196Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 6d7ae4f5-bb8c-4161-a756-ebc574ad849b · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 52
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.590497Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Observation 7912e838-b99e-4860-8f4c-ea455098b12c · outbound
This paper cites an unresolved cited work.
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection Unresolved cited work
Reference 53
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T22:00:58.575297Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-22T06:32:14.747728+00:00.
Pith citing papers
No inbound Pith citation observations are available.