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Integrity report for H2S assisted contact engineering: a universal approach to enhance hole conduction in all TMD Field-Effect Transistors and achieve ambipolar CVD MoS2 Transistors

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1901.02148 · pith:2019:IV6YOXNLDQ774NI3HVNXPEVITT

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Paper page arXiv integrity.json bundle.json

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Signed record

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