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Integrity report for Strain-induced programmable half-metal and spin-gapless semiconductor in an edge-doped boron nitride nanoribbon

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1601.05010 · pith:2016:JJKYOI63LRWS4N3Y67CDJOHPVF

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Paper page arXiv integrity.json bundle.json

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Signed record

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