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Integrity report for Electromagnetic Field Tapering in the High-Roughness Substrates Coated by a Thin Film of Manganese: A Lithography-Free Approach to Ultra-Broadband, Wide-Angle, UV to FIR Perfect Absorption

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1812.01987 · pith:2018:JVBSROIYETZQZY5JFMBABDPHGH

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Paper page arXiv integrity.json bundle.json

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Signed record

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