Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Evidence for universal relationship between the measured 1/f permittivity noise and loss tangent created by tunneling atoms
As of 14 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:1507.06043.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-11T16:54:27.809093Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-11T16:54:28.661041Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 69b4f8e9-fd9b-4c74-b5f9-4e06b2df3e6f · inbound
Low two-level-system noise in hydrogenated amorphous silicon cites this paper.
Low two-level-system noise in hydrogenated amorphous silicon Evidence for universal relationship between the measured 1/f permittivity noise and loss tangent created by tunneling atoms
Reference 33
- Resolution
- verified exact
- local_arxiv, observed 2026-08-11T16:54:28.674659Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.
Observation 76a6370c-345b-44ee-adb3-9e695341ec4e · inbound
Origins of microwave losses in superconducting circuits made with silicon-on-insulator substrates cites this paper.
Origins of microwave losses in superconducting circuits made with silicon-on-insulator substrates Evidence for universal relationship between the measured 1/f permittivity noise and loss tangent created by tunneling atoms
Reference 41
- Resolution
- unresolved
- no resolver link, observed 2026-08-03T12:39:14.486729Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.