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Integrity report for Visualizing topological insulating Bi2Te3 quintuple layers on SiO2-capped Si substrates and its contrast optimization

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1008.5230 · pith:2010:K3O2WTK4UGPJIZN3SGAV2BFJZ5

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Paper page arXiv integrity.json bundle.json

Detector runs

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Signed record

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