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Integrity report for MEMS-tunable dielectric metasurface lens using thin-film PZT for large displacements at low voltages

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2112.10130 · pith:2021:KJ7KHJMRFA5TFVEGRQSMZP3K3V

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Paper page arXiv integrity.json bundle.json

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Signed record

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