Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films
As of 11 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:cond-mat/0410510.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-11T06:34:44.6726+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-05-07T16:10:23.324426Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-05-11T23:51:18.217667Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 97345c4b-495c-4dc2-8028-18cd3190ac63 · inbound
Reversible Modulation of Thermal Conductivity in GaN via Strain-Driven Reorganization of Dislocation Ensembles cites this paper.
Reversible Modulation of Thermal Conductivity in GaN via Strain-Driven Reorganization of Dislocation Ensembles X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films
Reference 4
- Resolution
- verified exact
- arxiv_id, observed 2026-07-04T22:28:16.328289Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-11T06:34:44.6726+00:00.