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Integrity report for X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:cond-mat/0410510 · pith:2004:KJELWCBEZHSW5HXAZJ5P4PIQCV

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Paper page arXiv integrity.json bundle.json

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Signed record

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