pith. sign in

Integrity report for Measurements and simulations of X-ray radiation damage effects on CNM n-type 4H-SiC MOS capacitors

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.29375 · pith:2026:KZPNMN5NL7TADBY4X2IGW777RE

0Critical
0Advisory
3Detectors run
2026-05-30Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-05-30 01:45:46.846288+00:00
cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-29 17:24:48.360097+00:00
ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-29 01:34:29.059628+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/KZPNMN5N/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.