Paper Citation Record · LEDGER

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing

As of 17 August 2026, this Paper Citation Record lists 33 of 33 outbound references and 0 inbound Pith citation observations for arXiv:2608.03814.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2608.03814 v1

Coverage vector

measured 33 of 33 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-05T11:56:48.963457Z

measured 33 of 33 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

33 of 33 outbound references displayed

verified exact24
verified fuzzy1
unresolved1
parse uncertain0
malformed identifier1
metadata mismatch6

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation e42e1671-4ff6-4606-939f-c46fb40ad28c · outbound

This paper cites Sahu, S.T.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Sahu, S.T

Reference 1

Resolution: verified exact; doi, observed 2026-08-05T11:56:53.930660Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation a9b08fe6-c0fa-4266-9fc7-6913dc6ee9f6 · outbound

This paper cites Elliott, M.T.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Elliott, M.T

Reference 2

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.734156Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation c4ec08dd-2590-4506-ac7e-d794afccbf79 · outbound

This paper cites Bar-Cohen, J.J.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Bar-Cohen, J.J

Reference 3

Resolution: verified exact; doi, observed 2026-08-05T11:56:53.744395Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 01e0b451-d81a-45bd-b2d6-c8f5687456d0 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 4

Resolution: verified exact; doi, observed 2026-08-05T11:56:53.518404Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 06b8157d-6f3e-40e8-b5ac-c96c1f4dd972 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 5

Resolution: verified exact; doi, observed 2026-08-05T11:56:53.272386Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation db1c2c78-33bc-4277-9b9f-e55a447e9195 · outbound

This paper cites Domke, B.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Domke, B

Reference 6

Resolution: verified exact; doi, observed 2026-08-05T11:56:53.035951Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation bc25a212-0e8f-4667-8246-0e8e08eb2622 · outbound

This paper cites Cheng, Y.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Cheng, Y

Reference 7

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.610716Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 92b29df1-9a4b-4d29-95d4-13ee10990f63 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 8

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.483642Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 5018276b-8002-4d11-9db0-ad69af887a7c · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 9

Resolution: verified exact; doi, observed 2026-08-05T11:56:52.804672Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 26d55118-00d4-44a7-b8f4-b2994d2e7b9f · outbound

This paper cites Couairon, A.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Couairon, A

Reference 10

Resolution: unresolved; no resolver link, observed 2026-08-05T11:56:47.363471Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 7e2a327c-b955-4586-9334-0ae75d646978 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 11

Resolution: verified exact; doi, observed 2026-08-05T11:56:52.614781Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 0b476ccc-344d-426a-b41d-a8053c93cdfa · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 12

Resolution: verified exact; doi, observed 2026-08-05T11:56:52.328693Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 0d9050cf-e8bd-447b-93ca-d869ef7d6a49 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 13

Resolution: verified exact; doi, observed 2026-08-05T11:56:52.137519Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 53ba2856-6740-45b4-a1f4-f3139659ff3e · outbound

This paper cites Zhang, X.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Zhang, X

Reference 14

Resolution: verified exact; doi, observed 2026-08-05T11:56:52.014234Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 1b5a1d5d-2b97-4012-8705-0dcf352e39d4 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 15

Resolution: verified exact; doi, observed 2026-08-05T11:56:51.806366Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 06290a1f-7f7a-42ea-9a54-a869795a3ca1 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 16

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.360403Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 30d3fcb9-0bab-4150-9b62-449f42f63302 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 17

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.228425Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 10d8d773-4b38-400b-8a60-6a0df4d5184f · outbound

This paper cites Xiangfu, H.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Xiangfu, H

Reference 18

Resolution: verified exact; doi, observed 2026-08-05T11:56:51.621188Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation f3001136-2d14-454e-b031-d724d90393c4 · outbound

This paper cites Jiang, S.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Jiang, S

Reference 19

Resolution: metadata mismatch; raw_fallback, observed 2026-08-05T11:56:54.094607Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 75e8a1d7-e90d-4f18-b37d-bd1a3e8ec5d6 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 20

Resolution: verified exact; doi, observed 2026-08-05T11:56:51.425208Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 15b24fff-9717-4e37-b98a-df79d261b6f0 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 21

Resolution: verified exact; doi, observed 2026-08-05T11:56:51.173866Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 51d64544-fe78-4fac-a0e5-3b58ee22307d · outbound

This paper cites Boyd, A.L.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Boyd, A.L

Reference 22

Resolution: verified fuzzy; raw_fallback, observed 2026-08-05T11:56:54.769897Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 2900b3ea-5eb9-4342-b644-a1e11fa81d93 · outbound

This paper cites Bergé, S.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Bergé, S

Reference 23

Resolution: malformed identifier; no resolver link, observed 2026-08-05T11:56:48.194150Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 57683565-f051-4dfc-bea7-936702eb32e5 · outbound

This paper cites Marburger, Self-focusing: theory, Prog.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Marburger, Self-focusing: theory, Prog

Reference 24

Resolution: verified exact; doi, observed 2026-08-05T11:56:50.978912Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 9d5e34f9-1046-4d45-87bb-4c5b4d5fc40d · outbound

This paper cites Yuan, J.Y.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Yuan, J.Y

Reference 25

Resolution: verified exact; doi, observed 2026-08-05T11:56:50.754489Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 7d5b7671-8e9c-470f-afbb-aebc500cc151 · outbound

This paper cites Youn, D.H.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Youn, D.H

Reference 26

Resolution: verified exact; doi, observed 2026-08-05T11:56:50.569403Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation d07c316e-69ed-47fb-b059-a8d6c88730eb · outbound

This paper cites Nakashima, T.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Nakashima, T

Reference 27

Resolution: verified exact; doi, observed 2026-08-05T11:56:50.356593Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation bd8d2074-913a-4d20-87e4-f50c1621c2d5 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 28

Resolution: verified exact; doi, observed 2026-08-05T11:56:50.097759Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 182f0458-afe6-4813-b3f4-fce3cfebdc3b · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 29

Resolution: verified exact; doi, observed 2026-08-05T11:56:49.904683Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 6aa27a7c-4997-41df-b91c-d308e3b62148 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 30

Resolution: verified exact; doi, observed 2026-08-05T11:56:49.697486Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 61175a11-eb5c-47b4-8c88-e00edbe2a93d · outbound

This paper cites Lenhart, D.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Lenhart, D

Reference 31

Resolution: verified exact; doi, observed 2026-08-05T11:56:49.532351Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 93a11938-82b6-4a6b-839d-4857e6b0f563 · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 32

Resolution: verified exact; doi, observed 2026-08-05T11:56:49.357777Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Observation 52ce080d-db46-43db-b670-aa8aadd4321b · outbound

This paper cites an unresolved cited work.

Self-Focusing Control for Depth-Precise Wafer Slicing of 4H-SiC in Femtosecond Laser Processing Unresolved cited work

Reference 33

Resolution: verified exact; doi, observed 2026-08-05T11:56:49.159016Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

Pith citing papers

No inbound Pith citation observations are available.