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Paper Citation Record · LEDGER

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation

As of 17 August 2026, this Paper Citation Record lists 68 of 68 outbound references and 0 inbound Pith citation observations for arXiv:2607.29059.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.29059 v1

Coverage vector

measured 68 of 68 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-03T14:30:49.336787Z

measured 68 of 68 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

68 of 68 outbound references displayed

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External citation measurements

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Outbound references

Observation d07e9473-62fc-4aa3-9642-9fbc12be7aa1 · outbound

This paper cites In: Proceedings of the IEEE conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE conference on computer vision and pattern recognition

Reference 1

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Observation 6f49f7b0-efb1-481a-b321-1fc4468875ff · outbound

This paper cites Layer Normalization.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Layer Normalization

Reference 2

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This paper cites In: Proceedings eighth IEEE international conference on computer vision.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings eighth IEEE international conference on computer vision

Reference 3

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This paper cites IEEE Transactions on pattern analysis and machine intelligence (6), 679–698 (1986) 27.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation IEEE Transactions on pattern analysis and machine intelligence (6), 679–698 (1986) 27

Reference 4

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Observation ac3b91af-420f-4457-a87e-08b0be6edae7 · outbound

This paper cites Advances in neural information processing systems34, 10919–10930 (2021) 15.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Advances in neural information processing systems34, 10919–10930 (2021) 15

Reference 5

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Observation cb627e12-7fa8-448c-9a15-76515921187d · outbound

This paper cites In: Proceedings of the European conference on computer vision (ECCV).

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the European conference on computer vision (ECCV)

Reference 6

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This paper cites In: International conference on machine learning.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International conference on machine learning

Reference 7

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This paper cites In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

Reference 8

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This paper cites In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

Reference 9

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This paper cites Skin Lesion Analysis Toward Melanoma Detection 2018: A Challenge Hosted by the International Skin Imaging Collaboration (ISIC).

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Skin Lesion Analysis Toward Melanoma Detection 2018: A Challenge Hosted by the International Skin Imaging Collaboration (ISIC)

Reference 10

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This paper cites In: Proceedings of the IEEE conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE conference on computer vision and pattern recognition

Reference 11

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Observation e067adbe-acbe-4ad7-a181-32116036ebda · outbound

This paper cites In: International Conference on Learning Representations (2021) 11, 25, 34.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International Conference on Learning Representations (2021) 11, 25, 34

Reference 12

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This paper cites International journal of computer vision88, 303–338 (2010) 20.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation International journal of computer vision88, 303–338 (2010) 20

Reference 13

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This paper cites In: European conference on computer vision.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: European conference on computer vision

Reference 14

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This paper cites In: International Conference on Learning Representations (ICLR) (2015) 4, 6.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International Conference on Learning Representations (ICLR) (2015) 4, 6

Reference 15

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This paper cites In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

Reference 16

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This paper cites In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

Reference 17

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This paper cites In: Proceedings of the IEEE international conference on computer vision.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE international conference on computer vision

Reference 18

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Unresolved cited work

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Observation d552aeaf-b270-4949-b206-befc45e49f40 · outbound

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Gaussian Error Linear Units (GELUs)

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International Conference on Learning Representations (2020) 4, 6

Reference 21

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Advances in Neural Information Processing Systems36, 29914–29934 (2023) 12

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recog- nition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF International Conference on Computer Vision

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF Con- ference on Computer Vision and Pattern Recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF international conference on computer vision

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Advances in neural information processing systems24(2011) 4

Reference 30

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

Reference 31

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International conference on machine learning

Reference 32

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: European conference on computer vision

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recog- nition

Reference 34

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision

Reference 35

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This paper cites In: Computer vision– ECCV 2014: 13th European conference, zurich, Switzerland, September 6-12, 2014, proceedings, part v 13.

Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Computer vision– ECCV 2014: 13th European conference, zurich, Switzerland, September 6-12, 2014, proceedings, part v 13

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Decoupled Weight Decay Regularization

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Representation Learning with Contrastive Predictive Coding

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation PyTorch: An Imperative Style, High-Performance Deep Learning Library

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation note on regression and inheritance in the case of two parents

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: European Conference on Computer Vision

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: International conference on machine learning

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation IEEE transactions on pattern analysis and machine intelligence43(10), 3349–3364 (2020) 12

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Unresolved cited work

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation Advances in neural information processing systems34, 12077–12090 (2021) 2, 3

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceed- ings of the IEEE/CVF conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE/CVF Conference on Com- puter Vision and Pattern Recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: Proceedings of the IEEE conference on computer vision and pattern recognition

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Learning from Adversity: Semantic-Aware Mask Refinement through Adversarial Perturbation In: European Conference on Computer Vision

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