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Integrity report for 2-D materials for ultra-scaled field-effect transistors: hundred candidates under the ab initio microscope

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2004.04434 · pith:2020:MTJM7AJBYAYHJOYHXS5KVU543U

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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