Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-12T16:42:46.047914Z
Paper Citation Record · LEDGER
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument
As of 23 August 2026, this Paper Citation Record lists 48 of 48 outbound references and 0 inbound Pith citation observations for arXiv:2411.13265.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-23T06:30:58.430688+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
48 of 48 outbound references displayed
- verified exact2
- verified fuzzy35
- unresolved11
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 6b88da0a-5da9-40e3-923f-b4778720e07e · outbound
This paper cites Henderson.
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.960949Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 0945fabe-a900-4c7b-845c-d578b34d438a · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 2
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.944466Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation b5cf6d1a-b1e7-4650-8341-a65aedc04bf1 · outbound
This paper cites Vincent and P.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Vincent and P
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.928370Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 970da879-9277-442d-b4ab-4acf9b21b394 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 4
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.912576Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation d638b389-2090-4918-8ede-42db66725ecd · outbound
This paper cites Klar, Ya¸ sar Krysiak, Hongyi Xu, Gwladys Steciuk, Jung Cho, Xiaodong Zou, and Lukas Palatinus.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Klar, Ya¸ sar Krysiak, Hongyi Xu, Gwladys Steciuk, Jung Cho, Xiaodong Zou, and Lukas Palatinus
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.896098Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation d219dd71-4b8f-43e2-af4f-282f08cb2612 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.880350Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 526f00ce-1211-4876-9dc1-5e2c96f15e08 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 7
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.865137Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation a99dc7a9-f07a-4c85-9d62-09727edd34b1 · outbound
This paper cites Sieger, U.
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.849263Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation ed630440-c3dd-453d-8b0d-a1b9c7c1a00f · outbound
This paper cites White, Eiji Okunishi, Yoshitaka Aoyama, Akihito Yamano, Hiroyasu Sato, Joseph D.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument White, Eiji Okunishi, Yoshitaka Aoyama, Akihito Yamano, Hiroyasu Sato, Joseph D
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.832064Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation b384b456-52da-40fd-8327-052013184cbc · outbound
This paper cites Establishing a relativistic ultrafast electron diffraction & imaging (RUEDI) UK national facility.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Establishing a relativistic ultrafast electron diffraction & imaging (RUEDI) UK national facility
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.814881Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 80335978-149a-47f5-9118-b4897db273b8 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 11
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.798571Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation e3bd8e3b-d3b0-4c87-9334-8499cc667261 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 12
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.782810Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 4da65843-0c73-4436-9843-70ea6df00913 · outbound
This paper cites McMullan, A.
Reference 13
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.767249Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 42d5d8c6-a46b-4c3d-b617-a546b243df1a · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 14
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.751891Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 70d524ac-d163-4200-9dff-10e172ab35f3 · outbound
This paper cites Fast Pixelated Detectors in Scanning Transmission Electron Microscopy.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Fast Pixelated Detectors in Scanning Transmission Electron Microscopy
Reference 15
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.735925Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation cd01ef90-93b5-4ff9-bd9f-64a4a5c1e4e5 · outbound
This paper cites High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.719372Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation ff59a94d-2e84-471c-8e82-91973439e62c · outbound
This paper cites wet-STEM.
Reference 17
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.703178Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 2594b1a2-5f44-40c4-93b0-79274d80a1fc · outbound
This paper cites Caplins, Jason D.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Caplins, Jason D
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.687300Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 3826a92e-4191-4836-ba26-180056d97797 · outbound
This paper cites On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.671504Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation b69ef8ea-81a0-4ea1-b098-dba565ec6d85 · outbound
This paper cites Orekhov, D.
Reference 20
- Resolution
- unresolved
- no resolver link, observed 2026-08-12T16:42:45.909798Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 39fc903b-8fa1-4795-99d9-b45cafec1d12 · outbound
This paper cites Powder Nano- Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Powder Nano- Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.655999Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 33c3cda6-c946-4b05-8434-566a7db515fd · outbound
This paper cites Exploring 4DSTEM-in-SEM: From Imple- mentation to Material Characterization.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Exploring 4DSTEM-in-SEM: From Imple- mentation to Material Characterization
Reference 22
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.640087Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 07e43f15-ec20-4082-9836-6b81f0989992 · outbound
This paper cites Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM
Reference 23
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.623864Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 2a380773-e150-4c0c-a88b-64ed032f0bd8 · outbound
This paper cites Low-cost electron detector for scanning electron microscope.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Low-cost electron detector for scanning electron microscope
Reference 24
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.606878Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation ebfbcf30-7764-4665-bd86-20ad4468ce4f · outbound
This paper cites Characterization of a Timepix detector for use in SEM acceleration voltage range.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Characterization of a Timepix detector for use in SEM acceleration voltage range
Reference 25
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.590362Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 176ebda4-4934-4cce-a63d-607f0a0b336f · outbound
This paper cites Malis, S.
Reference 26
- Resolution
- unresolved
- no resolver link, observed 2026-08-12T16:42:45.941301Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 7ba624f9-c2f8-4fde-8065-f72999bc8726 · outbound
This paper cites Zhang, R.
Reference 27
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.574395Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 0a8ea3a4-c403-4719-b487-567173cf3f3a · outbound
This paper cites Brief review of image denoising techniques.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Brief review of image denoising techniques
Reference 28
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.558426Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 96bb7287-af54-4195-99ee-b47f2b92bb06 · outbound
This paper cites Lobato, T.
Reference 29
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.542641Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation bd520678-02b4-470c-899c-056a5c126dd6 · outbound
This paper cites A Threshold Selection Method from Gray-Level Histograms.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument A Threshold Selection Method from Gray-Level Histograms
Reference 30
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.526796Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation b67e313d-968c-4577-9db3-efb456f735bf · outbound
This paper cites Mardia and T.J.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Mardia and T.J
Reference 31
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.510252Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 14eaeb64-cc86-4e59-8333-e2e1ce918b14 · outbound
This paper cites A Computational Approach To Edge Detection.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument A Computational Approach To Edge Detection
Reference 32
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.494567Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 938c46b4-065a-470a-8b17-462d40bb75de · outbound
This paper cites Realtime Com- puter Vision with OpenCV: Mobile computer-vision technology will soon become as ubiquitous as touch interfaces.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Realtime Com- puter Vision with OpenCV: Mobile computer-vision technology will soon become as ubiquitous as touch interfaces
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.479372Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 2d6526d5-c58f-4e58-a98f-c8d39861c192 · outbound
This paper cites Lobato and D.
Reference 34
- Resolution
- unresolved
- no resolver link, observed 2026-08-12T16:42:45.983084Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation ce663be3-0c55-423a-bc8e-528d6f63d104 · outbound
This paper cites Liz-Marz´ an, and Sara Bals.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Liz-Marz´ an, and Sara Bals
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.463753Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation d838073b-ce48-44a0-822b-5261a0e20ddd · outbound
This paper cites Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals
Reference 36
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.447683Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 02280d8c-5828-4d17-888c-ec5ec6a15607 · outbound
This paper cites MacArthur, Duncan N.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument MacArthur, Duncan N
Reference 37
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.431347Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 0e067f54-71ff-46d5-964a-ba4e1d838e4a · outbound
This paper cites PeakNet: An Autonomous Bragg Peak Finder with Deep Neural Networks.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument PeakNet: An Autonomous Bragg Peak Finder with Deep Neural Networks
Reference 38
- Resolution
- verified exact
- local_arxiv, observed 2026-08-12T16:42:46.133993Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 08fa76f0-050a-444f-bf6c-2d5db6d0972b · outbound
This paper cites pyxem/pyxem: v0.19.1, June 2024.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument pyxem/pyxem: v0.19.1, June 2024
Reference 39
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.415720Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 41b4df5c-9f2a-4aee-b62e-6ed8b1672b22 · outbound
This paper cites py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
Reference 40
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.399765Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 4b720dd5-0453-427a-88b2-5ceb0cafd7e3 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 41
- Resolution
- unresolved
- raw_fallback, observed 2026-08-12T16:42:46.382403Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation f5f763a0-abf1-4ede-8f99-4fb778bdef74 · outbound
This paper cites Jannis, C.
Reference 42
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.365773Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation f2287319-4a63-48d0-9f7f-94d8febe95cb · outbound
This paper cites S’ari, J.
Reference 43
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.347830Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation 7b70131c-2778-495d-a86c-562e9ec1b627 · outbound
This paper cites CHAPTER 1 - BASIC PROPERTIES AND MEASURING METHODS OF NANOPARTICLES.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument CHAPTER 1 - BASIC PROPERTIES AND MEASURING METHODS OF NANOPARTICLES
Reference 44
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.329893Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation a8ba704f-4d65-4e25-944b-f0a4f21a22e9 · outbound
This paper cites Lupini, Scott D.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Lupini, Scott D
Reference 45
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.311677Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation d6f05b39-1d99-413f-a2fb-289f80376e61 · outbound
This paper cites Krivanek, Niklas Dellby, Matthew F.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Krivanek, Niklas Dellby, Matthew F
Reference 46
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.292965Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation d0eb46b3-21c3-4991-b7ef-89fde9f21ba2 · outbound
This paper cites Poikela, J.
Reference 47
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-12T16:42:46.276546Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Observation ee3f8420-d1af-4dfe-a54f-fd276fa20522 · outbound
This paper cites an unresolved cited work.
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument Unresolved cited work
Reference 2018
- Resolution
- verified exact
- doi, observed 2026-08-12T16:42:46.108627Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.
Pith citing papers
No inbound Pith citation observations are available.