Integrity report for Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1302.5660 · pith:2013:NN7Y4THLIVKFDEWXY4L4UK57UJ

0Critical

0Advisory

0Detectors run

—Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/NN7Y4THLIVKFDEWXY4L4UK57UJ/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.