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Integrity report for Effects of ozone post deposition treatment on interfacial and electrical characteristics of atomic-layer-deposited Al2O3 and HfO2 films on GaSb substrates

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1310.6457 · pith:2013:NOHXSLCCYCNBYNBZPRIIVPEZZM

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Paper page arXiv integrity.json bundle.json

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Signed record

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