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Comparing different solutions for testing resistive defects in low-power SRAMs

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arxiv 2112.15176 v1 pith:NP6EDVCT submitted 2021-12-30 cs.AR

Nunzio Mirabella , Michelangelo Grosso , Giovanna Franchino , Salvatore Rinaudo , Ioannis Deretzis , Antonino La Magna , Matteo Sonza Reorda This is my paper
classification cs.AR
keywords defectstestdifferentlow-powermethodsresistivetypesalgorithms
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Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes some types of such defects that may impair the device functionalities in subtle ways, depending on the defect characteristics, and that may not be directly or easily detectable by traditional test methods, such as March algorithms. We analyze different methods to test such defects and discuss them in terms of complexity and test time.

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