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Integrity report for Orientation Dependence of Ferroelectric Properties of Pulsed-Laser-Ablated Bi4-xNdxTi3O12 Films

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arXiv:cond-mat/0307233 · pith:2003:NQQ7667G5HS2P6L5RB64R3INYJ

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Paper page arXiv integrity.json bundle.json

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Signed record

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