Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-07-12T02:33:43.945800Z
Paper Citation Record · LEDGER
Evidence of length scale effect in contact electrification in conducting thin film heterostructures
As of 18 August 2026, this Paper Citation Record lists 3 of 3 outbound references and 0 inbound Pith citation observations for arXiv:2607.03428.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-18T06:34:40.430872+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
3 of 3 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved3
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 33dc03cc-effe-4d99-abdf-9daafd8d64b6 · outbound
This paper cites The contacting materials can be any type such as metal, insulator, semiconductor or polymer.
Evidence of length scale effect in contact electrification in conducting thin film heterostructures The contacting materials can be any type such as metal, insulator, semiconductor or polymer
Reference 1
- Resolution
- unresolved
- no resolver link, observed 2026-07-12T02:33:43.945800Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation c9cd5271-4cf4-4bfe-8690-03938d917bb1 · outbound
This paper cites G., Interlayer charge transfer from contact electrification in conducting micro and nanoscale thin film heterostructures.
Evidence of length scale effect in contact electrification in conducting thin film heterostructures G., Interlayer charge transfer from contact electrification in conducting micro and nanoscale thin film heterostructures
Reference 2
- Resolution
- unresolved
- no resolver link, observed 2026-07-12T02:33:43.945800Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation a6488f3e-e16a-49fd-b97b-f7dce1ac04fa · outbound
This paper cites M., Electrostatic Gating of Ultrathin Films.
Evidence of length scale effect in contact electrification in conducting thin film heterostructures M., Electrostatic Gating of Ultrathin Films
Reference 3
- Resolution
- unresolved
- no resolver link, observed 2026-07-12T02:33:43.945800Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Pith citing papers
No inbound Pith citation observations are available.