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Integrity report for High polarization, endurance and retention in sub-5 nm Hf_(0.5)Zr_(0.5)O₂ films

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arXiv:2005.14477 · pith:2020:OO6QMNVF5ZNNZXUR67ULFCO6Z6

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Paper page arXiv integrity.json bundle.json

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Signed record

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