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Integrity report for Raman spectroscopy and electrical properties of InAs nanowires with local oxidation enabled by substrate micro-trenches and laser irradiation

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1601.06583 · pith:2016:ORUHYRUE7RTMYTQ26PUHRA7DTO

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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