Integrity report for A variability-aware simulation and design workflow for wafer-scale, heterogeneously integrated lithium niobate modulators

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.28765 · pith:2026:PJLYHN7AK63JLAQKVI643WAYG3

0Critical

0Advisory

6Detectors run

2026-05-30Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-05-30 03:25:47.880340+00:00

external_links completed v1.0.0 · findings 0 · 2026-05-28 17:31:47.026428+00:00

shingle_duplication skipped v0.1.0 · findings 0 · 2026-05-28 09:50:00.177823+00:00

citation_quote_validity skipped v0.1.0 · findings 0 · 2026-05-28 03:50:24.333648+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-28 02:53:50.530874+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-28 02:34:18.908572+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/PJLYHN7A/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.