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Integrity report for Interfacial Phonon Scattering and Transmission Loss in >1 um Thick Silicon-on-insulator Thin Films

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1712.05756 · pith:2017:QGQQZT6J5JVYU463GGKBZRMEGB

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Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

Findings

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Signed record

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