Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Refractive index of nanoscale thickness films measured by Brewster refractometry
As of 16 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:1504.04262.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-14T14:51:30.925394Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-14T14:51:31.011924Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation ae0b95f2-bc2b-4065-b209-7f0be4a25368 · inbound
Refractometry of birefringent materials at Brewster angle cites this paper.
Refractometry of birefringent materials at Brewster angle Refractive index of nanoscale thickness films measured by Brewster refractometry
Reference 3
- Resolution
- verified exact
- local_arxiv, observed 2026-08-14T14:51:31.017103Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.