Integrity report for FAB-Bench: A Framework for Adaptive RAG Benchmarking in Semiconductor Manufacturing

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2605.26476 · pith:2026:RHG2LJNFFDZLS6LYT667VVRDAT

0Critical

0Advisory

4Detectors run

2026-05-29Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-05-29 07:45:11.960515+00:00

citation_quote_validity skipped v0.1.0 · findings 0 · 2026-05-27 23:50:21.401514+00:00

cited_work_retraction completed v1.0.0 · findings 0 · 2026-05-27 15:53:44.017578+00:00

ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-05-27 02:34:12.421099+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/RHG2LJNFFDZLS6LYT667VVRDAT/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.