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Integrity report for Compositional dependence of epitaxial Tin+1SiCn MAX-phase thin films grown from a Ti3SiC2 compound target

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1901.05904 · pith:2019:RJKNFWH73ASBSRDHDZVG6HDUCF

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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