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Integrity report for Self-Assembled formation of long, thin, and uncoalesced GaN nanowires on crystalline TiN films

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1801.02966 · pith:2018:SIARYCUQXAXA2ABDAG27LDMP5K

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Paper page arXiv integrity.json bundle.json

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Findings

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Signed record

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