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Integrity report for Schottky Barrier Height Engineering In β-Ga₂O₃ Using SiO₂ Interlayer Dielectric

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arXiv:2001.07326 · pith:2020:SOYR7TZW2BXV4NU3534ZEB2EUH

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Paper page arXiv integrity.json bundle.json

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Signed record

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