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Performance tests of an AGIPD 0.4 assembly at the beamline P10 of PETRA III

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arxiv 1303.2502 v2 pith:SQQWAXF7 submitted 2013-03-11 physics.ins-det

classification physics.ins-det
keywords agipdchipdetectortestassemblybeamlinedesymeasurements
verification ladder T0 review T1 audit T2 compute T3 formal
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The Adaptive Gain Integrating Pixel Detector (AGIPD) is a novel detector system, currently under development by a collaboration of DESY, the Paul Scherrer Institute in Switzerland, the University of Hamburg and the University of Bonn, and is primarily designed for use at the European XFEL. To verify key features of this detector, an AGIPD 0.4 test chip assembly was tested at the P10 beamline of the PETRA III synchrotron at DESY. The test chip successfully imaged both the direct synchrotron beam and single 7.05 keV photons at the same time, demonstrating the large dynamic range required for XFEL experiments. X-ray scattering measurements from a test sample agree with standard measurements and show the chip's capability of observing dynamics at the microsecond time scale.

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