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Integrity report for Theoretical Analysis of Drag Resistance in Amorphous Thin Films Exhibiting Superconductor-Insulator-Transition

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1005.2597 · pith:2010:THKYOSF6X3OGVPKHPHZ2C4SOKD

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Paper page arXiv integrity.json bundle.json

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Signed record

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