Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
As of 21 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2103.07076.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-21T06:32:19.484+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-16T05:48:07.067112Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-16T05:48:07.266485Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 6253f9bf-dc8e-4f59-aa1f-6316b62d06e2 · inbound
St4DeM: A software suite for multi-modal 4D-STEM acquisition techniques cites this paper.
St4DeM: A software suite for multi-modal 4D-STEM acquisition techniques Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
Reference 9
- Resolution
- verified exact
- local_arxiv, observed 2026-08-16T05:48:07.272554Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.