pith. sign in

arxiv: 1210.7763 · v2 · pith:TMGR7B6Znew · submitted 2012-10-29 · ⚛️ physics.optics

Optical Absorption Measurements on Crystalline Silicon at 1550nm

classification ⚛️ physics.optics
keywords absorptioncrystallinesiliconmeasuredmeasurementsopticalsamplealpha
0
0 comments X
read the original abstract

Crystalline silicon is currently being discussed as test-mass material for future generations of gravitational wave detectors that will operate at cryogenic temperatures. We present optical absorption measurements on a large-dimension sample of crystalline silicon at a wavelength of 1550nm at room temperature. The absorption was measured in a monolithic cavity setup using the photo-thermal self-phase modulation technique. The result for the absorption coefficient of this float-zone sample with a specific resistivity of 11kOhm cm was measured to be \alpha_A=(264 +/- 39)ppm/cm.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.