Pith. sign in

Paper Citation Record · LEDGER

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions

As of 12 August 2026, this Paper Citation Record lists 65 of 65 outbound references and 0 inbound Pith citation observations for arXiv:2501.03343.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2501.03343 v1

Coverage vector

measured 65 of 65 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-10T21:59:06.725186Z

measured 65 of 65 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

65 of 65 outbound references displayed

  • verified exact29
  • verified fuzzy9
  • unresolved10
  • parse uncertain0
  • malformed identifier5
  • metadata mismatch12

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 271477db-788b-4601-bd89-eaa96fec2a1c · outbound

This paper cites D -Wave Previews Next -Generation Quantum Computing Platform | D -Wave Systems.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions D -Wave Previews Next -Generation Quantum Computing Platform | D -Wave Systems

Reference 1

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.681884Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.397585Z digest=sha256:665a7da857203438c62c71e74cd116697437386f6e17d169ce50a90191d80f6f

Observation 81730efa-59b9-4e05-841a-3e0c47231e23 · outbound

This paper cites AC -Biased shift registers as fabrication process benchmark circuits and flux trapping diagnostic tool,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions AC -Biased shift registers as fabrication process benchmark circuits and flux trapping diagnostic tool,

Reference 2

Resolution
malformed identifier
no resolver link, observed 2026-08-10T21:59:06.499937Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.499937Z digest=sha256:61cd74f8403556fca107347c9f962fa2a9664347da2933cbcee7d696f4ddb03d

Observation 1ae064a7-404b-498d-9362-673a81135627 · outbound

This paper cites Yield evaluation of 10 -kA/cm2 Nb multi -layer fabrication process using conventional superconducting RAMs,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Yield evaluation of 10 -kA/cm2 Nb multi -layer fabrication process using conventional superconducting RAMs,

Reference 3

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:08.475201Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.504290Z digest=sha256:26e6e47ad44fa78c9a2541300b388bc22b450ea02b9f80757d02cf6145fa787e

Observation 1270c27c-0707-4f38-8df2-cb2e023ad856 · outbound

This paper cites Nb 9 -layer fabrication process for superconducting large-scale SFQ circuits and its pro cess evaluation,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Nb 9 -layer fabrication process for superconducting large-scale SFQ circuits and its pro cess evaluation,

Reference 4

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.508634Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.508634Z digest=sha256:abeb6cdb11e9e816bb65e2bf42e0f75e057dbc95aef6b60d4acf064c590a5eab

Observation 290a9258-be6c-428a-ae0b-2e04c9e31f24 · outbound

This paper cites New ac -powered SFQ digital circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions New ac -powered SFQ digital circuits,

Reference 5

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:08.395757Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.512647Z digest=sha256:19635991c018df8a33776d0a6a163e2943bc7a15e19fe493ee68a123dc3d172b

Observation e36a7692-810a-4d51-9918-7641eb7edca0 · outbound

This paper cites Reproducible operating margins on a 72800-device digital superconducting chip,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Reproducible operating margins on a 72800-device digital superconducting chip,

Reference 6

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.089903Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.516856Z digest=sha256:a3c7d866c91a8c246ce396f27789d40d07894140518d245094bd6aea6899168a

Observation 401cbaca-0183-42f5-b5e7-94f58a536fcf · outbound

This paper cites Fabrication process for superconducting digital circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Fabrication process for superconducting digital circuits,

Reference 7

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.079585Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.520936Z digest=sha256:3cc623dea3782713099d94b53bad236d4ea7bede9bfef46fc222e203b0a656f4

Observation 627e557a-f8e7-4a93-bb29-ff8698459feb · outbound

This paper cites MANA: A m onolithic adiabatic i ntegration architecture microprocessor using 1.4 -zJ/op unshunted superconductor Josephson junction devices,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions MANA: A m onolithic adiabatic i ntegration architecture microprocessor using 1.4 -zJ/op unshunted superconductor Josephson junction devices,

Reference 8

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:08.325882Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.524615Z digest=sha256:64f20189759f5be0c9e22fcc1e6fadaefc8477740a17312044a8560d9b03bb5c

Reference 9

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.670547Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.527855Z digest=sha256:1ac8088033c62cb33ba3724446f897867bc406d5123ca6ed94fc50e5f32e6cdb

Observation c4b69c33-14e1-44a0-bbd1-e071c6c4f1f7 · outbound

This paper cites Superconductor electronics: scalability and energy efficiency issues,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Superconductor electronics: scalability and energy efficiency issues,

Reference 10

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.531754Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.531754Z digest=sha256:cfbbb34bf7c8a7d42d9d50885c628459488f876cc4cca752663566e983f786d8

Observation c4c317e8-4adc-4000-8768-336a22fa4c16 · outbound

This paper cites Scalability of superconductor electronics: Limitations imposed by ac clock and flux bias transformers,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Scalability of superconductor electronics: Limitations imposed by ac clock and flux bias transformers,

Reference 11

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.535327Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.535327Z digest=sha256:f863a1057f2d1e4ee09e5690f7d621a6ad23da56554b1ce495222d96555cf057

Observation 39c38eaf-158c-487d-af07-6c252b18eae7 · outbound

This paper cites How moats protect superconductor films from flux trapping ,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions How moats protect superconductor films from flux trapping ,

Reference 12

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:08.183269Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.538945Z digest=sha256:327693496727ffca57ed3784ee7b4b492148cc06052652ba8830bac1eb2db0ab

Observation e6e2b710-e964-46fa-89d9-1e2cdbfbea96 · outbound

This paper cites Flux t rapping in superconducting circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Flux t rapping in superconducting circuits,

Reference 13

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:08.119821Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.542645Z digest=sha256:8b74af39fa275f13403b43e2bc78307558e42b3f2d15056bc32d2855ab867628

Observation 720ac2a4-7ab8-4f21-9587-73997189eee4 · outbound

This paper cites Evaluation of flux trapping in superconducting circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Evaluation of flux trapping in superconducting circuits,

Reference 14

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.546049Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.546049Z digest=sha256:d1f7a815cc3d81ef99d0957be3b28efa570b718e00688d2bc531c1394b98f240

Observation 25659ae4-07ef-4265-80aa-87ab7d9c9269 · outbound

This paper cites RSFQ 1024-bit shift register for acquisition memory,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions RSFQ 1024-bit shift register for acquisition memory,

Reference 15

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.062767Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.549770Z digest=sha256:8d1a98f4796e794719ceeefe59d0a752a9e7e3ca8ed2068e35b16e840450712c

Observation b3697204-6503-400a-a1f8-84ac8108924d · outbound

This paper cites A compact AQFP logic cell design using an 8 -metal layer superconductor process,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions A compact AQFP logic cell design using an 8 -metal layer superconductor process,

Reference 16

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.052136Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.553234Z digest=sha256:bdb0019542cff6196f4d5c30219a34aa17aed3b1083d053f585432b025b92f81

Observation f7278c43-ecd7-497f-9cb5-60b9302bb8e4 · outbound

This paper cites The magnetic properties of superconducting alloys,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions The magnetic properties of superconducting alloys,

Reference 17

Resolution
malformed identifier
no resolver link, observed 2026-08-10T21:59:06.556932Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.556932Z digest=sha256:dfd7a9832db0ff2f1f10abe7b5aff3093c81763fc36ec778643de4948632d441

Observation 2767aebc-c508-40f6-82d6-8d06ee626df5 · outbound

This paper cites Physics or Superconductors,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Physics or Superconductors,

Reference 18

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.658929Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.560664Z digest=sha256:23b926789fb684cd8153650d3a6e6943c635aa857937d07d801128415b58def0

Observation 385b3800-789a-4ac1-a803-b68216313a24 · outbound

This paper cites The lower critical field in the Ginzburg -Landau theory of superconductivity,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions The lower critical field in the Ginzburg -Landau theory of superconductivity,

Reference 19

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.025788Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.564886Z digest=sha256:f14cfe3e39f3ceabeb87527a6c175fb816473fddfcd8610aba5284d251318744

Observation b9ee491b-8810-4bb4-9322-3cedbd1cbec3 · outbound

This paper cites The structure of a vortex line and the lower critical field in superconducting alloys,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions The structure of a vortex line and the lower critical field in superconducting alloys,

Reference 20

Resolution
verified exact
doi, observed 2026-08-10T21:59:07.013608Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.568409Z digest=sha256:cf2ee3792db57d56b610696c621f93c1ee16e80d0e2e28f1b755f553ef28f6b1

Observation e052c810-a690-4bd2-8c8a-bc0135e88765 · outbound

This paper cites b ad flux trapping.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions b ad flux trapping

Reference 21

Resolution
malformed identifier
raw_fallback, observed 2026-08-10T21:59:08.691753Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.391839Z digest=sha256:d0ade779714a723530cb77d0496d0ab2e2e8f69802232a96c2694c1d134d655e

Observation 9dc04a66-b194-40ab-ba05-1bc70605461c · outbound

This paper cites Current distribution in superconducting films carrying quantized fluxoids,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Current distribution in superconducting films carrying quantized fluxoids,

Reference 22

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.571825Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.571825Z digest=sha256:6a7e055655a4f6e7ff1fdc3525664eb6844efa56134bff2ee69485d3c5274238

Observation ea140a63-c0de-4a20-ac0b-5ed4fa55eb4b · outbound

This paper cites The formation of a mixed state in planar superconductor films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions The formation of a mixed state in planar superconductor films,

Reference 23

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.995844Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.575176Z digest=sha256:dbc24c23ec6d10e3e126dab4faffb47d8e6ca7a91406b505760b99f10db4534a

Observation f4f93eb9-215a-4306-832f-fc43c6027147 · outbound

This paper cites Flux penetration in a thin superconducting disk,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Flux penetration in a thin superconducting disk,

Reference 24

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.984621Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.578350Z digest=sha256:5842060f4d937097f13ea4343abb459c8407f29f3e7d57c63e72a9fd5059fa5e

Observation fee59ef9-1e33-4fc4-8866-b2592f0bbba3 · outbound

This paper cites Pearl's vortex near the film edge,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Pearl's vortex near the film edge,

Reference 25

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.973215Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.581809Z digest=sha256:484d48ea6c6dd866e8014459222c47f007ed2e237e92f819ef4c6f9c1ae41294

Observation e1a96f86-f63a-4190-9f61-8ab7e26e346a · outbound

This paper cites Mixed state and critical current in narrow semiconducting films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Mixed state and critical current in narrow semiconducting films,

Reference 26

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.961382Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.585209Z digest=sha256:2a6e43a768766ccb6921e2ed5d0022835d1468254f77861115308faf168c77e4

Observation 5af6eb8a-f552-478e-ad2a-2726e269b90e · outbound

This paper cites Properties of mesoscopic superconducting thin-film rings: London approach,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Properties of mesoscopic superconducting thin-film rings: London approach,

Reference 27

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.950942Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.589402Z digest=sha256:f522dd6829bae9f7bb053d7becf742683deb893d527d906de45f1f1d2cb54569

Observation 3aa702d0-0e63-432b-9184-61146aa78466 · outbound

This paper cites Surface barrier in type- II superconductors,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Surface barrier in type- II superconductors,

Reference 28

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.592664Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.592664Z digest=sha256:aba295171abbbca5137de27000d70c61ada6bb8780f2b90cc78d63f30706861b

Observation e658eb3c-eafb-4dce-b313-1093e07a5adf · outbound

This paper cites Destruction of long -range order in one -dimensional and tow-dimensional systems possessing a continuous symmetry group. II. Quantum systems,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Destruction of long -range order in one -dimensional and tow-dimensional systems possessing a continuous symmetry group. II. Quantum systems,

Reference 29

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.648269Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.596412Z digest=sha256:925bf597dbb0ea8b8457d6a17480b94331be2f7dae793349de7b9e8a81a516b8

Observation 23a3b730-16bf-4711-8874-f5a2eaca1236 · outbound

This paper cites Ordering, metastability and phase transitions in two-dimensional systems,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Ordering, metastability and phase transitions in two-dimensional systems,

Reference 30

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.638060Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.600123Z digest=sha256:53d08e089f4d34aa780dce5dc5ef863984c4796fa5c457aa46d36f5201a368e9

Observation 2ffa04f1-55c5-48c6-af04-ce7dcfad75ec · outbound

This paper cites Critical field for complete vortex expulsion from narrow superconducting strips,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Critical field for complete vortex expulsion from narrow superconducting strips,

Reference 31

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.933403Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.603276Z digest=sha256:5aa5b80017539f7038a79b1da3df52de86166df047839c380ce75c0d9a7b6fb9

Observation 3afd1ac6-f489-493a-ab95-f3fc72fdb973 · outbound

This paper cites Vortex trapping and expulsion in thin -film YBaCuO strips,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Vortex trapping and expulsion in thin -film YBaCuO strips,

Reference 32

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.922338Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.606785Z digest=sha256:5e69b18a86ecc50115bc63c77c96d95286a5b6249bbabbda29c0078155bac327

Observation 29b6a749-f4e2-4489-bf2a-0d4b90cbfa6a · outbound

This paper cites Vortex trapping and expulsion in thin -film type-II superconducting strips,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Vortex trapping and expulsion in thin -film type-II superconducting strips,

Reference 33

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.963188Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.610361Z digest=sha256:8385da3f1650e669e206734a1b0380666fa78f50d09ccf6cacdaefc77924046e

Observation 436cc4f0-b9b4-47c1-82bc-166a0b3b4ee7 · outbound

This paper cites Critical fields for vortex expulsion from narrow superconducting strips,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Critical fields for vortex expulsion from narrow superconducting strips,

Reference 34

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.912436Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.613800Z digest=sha256:65943382e2b7ebc9661dd3326a5492951038d8474315a3dcac7f7ea673456b71

Observation 9b9077ae-ff38-4ec2-8a20-d5aff0d54d6a · outbound

This paper cites Collective pinning,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Collective pinning,

Reference 35

Resolution
malformed identifier
no resolver link, observed 2026-08-10T21:59:06.617628Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.617628Z digest=sha256:2fc13510d742a0eb1046726dd860210b2bab4064e21e38aab364772b70b6b209

Observation 2423fce8-acfa-40e2-b454-e512cfbbf136 · outbound

This paper cites Meissner response of superconductors with inhomogeneous penetration depths,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Meissner response of superconductors with inhomogeneous penetration depths,

Reference 36

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.895128Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.621306Z digest=sha256:e01a133cf4510b9090dbe7c642556834a9d52af09efde38792a87af88fa46ee6

Observation ed4bb826-1096-4f37-b615-a478363771d2 · outbound

This paper cites Moat-guarded Josephson SQUIDs,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Moat-guarded Josephson SQUIDs,

Reference 37

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.896387Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.624836Z digest=sha256:73e16ab82b35ef7e1aa8f8b01f62192baf316c7b4e4d26323e096ac5ac5c9eb3

Observation 3e19dfe3-e192-41fb-95f7-ace8e342aff0 · outbound

This paper cites Magnetic imaging of moat‐guarded superconducting electronic circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Magnetic imaging of moat‐guarded superconducting electronic circuits,

Reference 38

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.885590Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.628386Z digest=sha256:1332033ad47b60b7eee04796a0a454f256889f80b3c09d81e0cc394c50de639c

Observation c0080999-1f7e-4922-b102-aa9ef11209e8 · outbound

This paper cites Imaging magnetic fields,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Imaging magnetic fields,

Reference 39

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.876134Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.632168Z digest=sha256:7592374dfd8be5d1d71b596fb555ee707be63f321eb2881b6eccdc90fb4f9e33

Observation f8d5df40-d10f-4f37-956e-59e5e0bda956 · outbound

This paper cites an unresolved cited work.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Unresolved cited work

Reference 40

Resolution
unresolved
raw_fallback, observed 2026-08-10T21:59:08.627818Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.635820Z digest=sha256:bb4326beb5ea73a41716c8142fcbce2332a51002a18067117ead6539e61d0a68

Observation 101b3ca4-63c7-4e41-b149-9ecb91d9d7f8 · outbound

This paper cites Experimental verification of moat design and flux trapping analysis,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Experimental verification of moat design and flux trapping analysis,

Reference 41

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.617127Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.639172Z digest=sha256:aaa7e873939c01a90864c450ad0f6250e103a7e26bf36e6af6196d9415dedd2d

Observation 1673bf29-5431-4607-90c9-2d751784e6a0 · outbound

This paper cites The effect of quantized flux on AQFP circuits for a double -active-layered niobium fabrication process,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions The effect of quantized flux on AQFP circuits for a double -active-layered niobium fabrication process,

Reference 42

Resolution
malformed identifier
raw_fallback, observed 2026-08-10T21:59:07.818667Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.642523Z digest=sha256:21e3d092e374027c41e242f912a65ddcdf5155774dc51631ad5e77aae5d0c8e0

Observation 48eb0252-45c2-4a5a-8b89-f4cd87bbaab6 · outbound

This paper cites Extraction and Simulation of the Impact of Flux Trapping in Moats of AC-Biased Shift Registers.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Extraction and Simulation of the Impact of Flux Trapping in Moats of AC-Biased Shift Registers

Reference 43

Resolution
verified exact
local_arxiv, observed 2026-08-10T21:59:07.741865Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.646042Z digest=sha256:a9c7614258f65822aafe2d0c7ac71d1a0d91f6693bd15d8f7b80affafac00eb4

Observation 2eb38763-015d-4a69-b20d-54057343fd51 · outbound

This paper cites Characterization of A diabatic Quantum- Flux-Parametrons in the MIT LL SFQ5ee+ p rocess,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Characterization of A diabatic Quantum- Flux-Parametrons in the MIT LL SFQ5ee+ p rocess,

Reference 44

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.606284Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.650024Z digest=sha256:73293757a7cbde008786b64e5cfbb9721a972634538c4db806ac5a183240fc28

Observation 1fdecb49-fa90-486c-9f72-5c12fe5693bb · outbound

This paper cites 3D active demagnetization of cold magnetic shields,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions 3D active demagnetization of cold magnetic shields,

Reference 45

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.726846Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.653558Z digest=sha256:7c395d2a3a9dd3568ed12f495db0e7e14384282997b92d537ccebd5628990df5

Observation d98ad889-d6c4-49ed-b1ed-7cc4e9b51742 · outbound

This paper cites Inductance of superconductor integrated circuit features with sizes down to 120 nm,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Inductance of superconductor integrated circuit features with sizes down to 120 nm,

Reference 46

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.866488Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.656893Z digest=sha256:ce7594cc9e17bb3b83a6f0526f676ce669522dfad61b794eb6be4e656139ac21

Observation ef27c260-57ab-4b7c-9e28-6880e704dee0 · outbound

This paper cites Mutual and self-Inductance in planarized multilayered superconductor integrated circuits: Microstrips, striplines, bends, meanders, ground plane perforations,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Mutual and self-Inductance in planarized multilayered superconductor integrated circuits: Microstrips, striplines, bends, meanders, ground plane perforations,

Reference 47

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.660494Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.660494Z digest=sha256:850cbff8b6f3cc5ca560613a5a64d62d0c3e5cc1455ac77d8baf9bbad78883c5

Observation 5b57f240-6194-4dbb-973b-27778f7e6db3 · outbound

This paper cites Superconductor electronics fabrication process with MoNx kinetic inductors and s elf-shunted Josephson j unctions,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Superconductor electronics fabrication process with MoNx kinetic inductors and s elf-shunted Josephson j unctions,

Reference 48

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.577896Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.664155Z digest=sha256:2837e7064cfadea427e48c561413b42ef67231b36bc82f39181b3471be61cdd1

Observation d45a295c-475f-4d8f-ab0c-e06a10e841e2 · outbound

This paper cites Advanced fabrication processes for superconducting very large-scale integrated circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Advanced fabrication processes for superconducting very large-scale integrated circuits,

Reference 49

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.512423Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.667572Z digest=sha256:38d1e17b5c7c5b0b756758e666d13d11c7f93f3515c71a5a9137481c8790f876

Observation bfd997ef-7597-42b5-84c7-6f60a4aaf40a · outbound

This paper cites Advanced fabrication processes for superconductor electronics: Current s tatus and new developments,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Advanced fabrication processes for superconductor electronics: Current s tatus and new developments,

Reference 50

Resolution
unresolved
no resolver link, observed 2026-08-10T21:59:06.670760Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:59:06.670760Z digest=sha256:f7fd5793cd990a0d88d22e611fe140dd84da9fda95088aef0a72231db71ecca8

Observation 57502564-c410-4826-bc53-1cb92468d591 · outbound

This paper cites A 150-nm node of an eight-Nb-layer fully planarized process for superconductor electronics ,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions A 150-nm node of an eight-Nb-layer fully planarized process for superconductor electronics ,

Reference 51

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.595784Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.674624Z digest=sha256:a76ae32cf7f9c35c85cf31d7157b382ea57347674a10dddad787b843e954e607

Observation 029e4c8f-37dc-4cb1-9847-54ff756e01f0 · outbound

This paper cites Increasing integration scale of superconductor electronics beyond one million Josephson junctions,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Increasing integration scale of superconductor electronics beyond one million Josephson junctions,

Reference 52

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.855435Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.677802Z digest=sha256:a72ac46eb302f6fc7b13aca62c79a571197787b6ddc8b69eedd4abf212593041

Observation a7923856-e439-43ed-bed5-fe73d104d2c2 · outbound

This paper cites an unresolved cited work.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Unresolved cited work

Reference 53

Resolution
unresolved
raw_fallback, observed 2026-08-10T21:59:08.584760Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.681086Z digest=sha256:bb3d20f2af7f08f5f1ab85689302ee79a888e08dd10981c5dd8d32ff8d519d96

Observation f0e41655-9093-4b59-89ad-a10788e76107 · outbound

This paper cites Available: http://www.redhitech.com/.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Available: http://www.redhitech.com/

Reference 54

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:59:08.574227Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.684562Z digest=sha256:574923644cdff0a8e98884924689f83573eef46523b1c94ffdb6c2094279a0c3

Observation 218c80f7-aedf-4b7f-ad99-b0b9f578bce1 · outbound

This paper cites Inductance of c ircuit structures for MIT LL superconductor electronics fabrication process with 8 niobium layers,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Inductance of c ircuit structures for MIT LL superconductor electronics fabrication process with 8 niobium layers,

Reference 55

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.385267Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.688103Z digest=sha256:02c6d28cc40dac08fc19b7115b962cc76f5a26d953411cab3bd48cfc8dcc55ff

Observation 338aa3d7-aa44-4ea4-b3ff-61499f2dcad7 · outbound

This paper cites Fabrication p rocess and properties of fully-planarized deep-submicron Nb/Al– AlO x/Nb Josephson junctions for VLSI circuits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Fabrication p rocess and properties of fully-planarized deep-submicron Nb/Al– AlO x/Nb Josephson junctions for VLSI circuits,

Reference 56

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:59:07.240571Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.691823Z digest=sha256:7803923747a0ca86b85d14211ed66c11b6f73fd774f4061162e41f7992945a04

Observation 9789effb-afd2-4a6f-9ab8-69cb0fde1181 · outbound

This paper cites Structure of superconductive vortices near a metal-air interface,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Structure of superconductive vortices near a metal-air interface,

Reference 57

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.845460Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.695345Z digest=sha256:7a6ef84a95d0c5c9ee40b8bbf7a5eba352ee80275a8bdba82c3dbe969deeae66

Observation 28bc7124-f3db-4081-8313-9ee68774cf03 · outbound

This paper cites Magnetic coupling between two adjacent type- II superconductors,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Magnetic coupling between two adjacent type- II superconductors,

Reference 58

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.834740Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.698983Z digest=sha256:7fb78429ce6a6f39905cbfd4a30d54eb36fcf394bf9a7b76df5979e894571fd3

Observation 6a94801a-9a62-4ad0-8dfe-0aae1c3fa038 · outbound

This paper cites Flux pinning and flux-flow resistivity in magnetically coupled superconducting films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Flux pinning and flux-flow resistivity in magnetically coupled superconducting films,

Reference 59

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.824849Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.702676Z digest=sha256:4d222de50b79b6985f22f77fd4808c4ec52df7f699bd8fcddd297d6db4abcc19

Observation 1ce11a90-403c-47ef-a291-44a4b488720e · outbound

This paper cites Fluxon coupling in dual thin films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Fluxon coupling in dual thin films,

Reference 60

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.814293Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.705942Z digest=sha256:93ffa4cd56d0959e41d6eeca38286547371e4b60d8f47947e31fef2245c7bb10

Observation f018af46-9add-467d-b737-b8f711cc97fd · outbound

This paper cites Superconducting dc transformer coupling,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Superconducting dc transformer coupling,

Reference 61

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.803289Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.709659Z digest=sha256:682b7b926117d9edcfd5620f19c727e180ceb8f84d2bad8901fc7a64d2a4252c

Observation 7cc3ac34-f53d-40be-abd7-a675a0012f86 · outbound

This paper cites Theory of magnetically coupled type -II superconducting films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Theory of magnetically coupled type -II superconducting films,

Reference 62

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.792905Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.713600Z digest=sha256:4fa4a97f395b01e044a668fbf597788a1bf6d0ac03d6311c1788c0939f99a565

Observation 1fbe7ba1-a6fa-46ee-86ea-073c106aa8d6 · outbound

This paper cites Theory of the coupling in magnetically coupled type -II superconducting films,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Theory of the coupling in magnetically coupled type -II superconducting films,

Reference 63

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.781873Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.717092Z digest=sha256:9afc89e17896378cc9b36fc24f1001e9b7937708d79db6418b3eb9a39fe7c1be

Observation 6823db70-47ca-4950-8ace-8f676dbd6932 · outbound

This paper cites Two-dimensional vortices in a stack of thin superconducting films: A model for high -temperature superconducting multilayers,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Two-dimensional vortices in a stack of thin superconducting films: A model for high -temperature superconducting multilayers,

Reference 64

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.770798Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.720936Z digest=sha256:30d3b55102df357513b39312a47d399d533d8861d8828c6f2d718cb17f525c97

Observation 10fe12fd-95d3-4e32-9f0b-57ccd5925c05 · outbound

This paper cites Geometrical edge barriers and magnetization in superconducting strips with slits,.

Characterization of Flux Trapping in and Fabrication of Large-Scale Superconductor Circuits Using AC-Biased Shift Registers With 108500 Josephson Junctions Geometrical edge barriers and magnetization in superconducting strips with slits,

Reference 65

Resolution
verified exact
doi, observed 2026-08-10T21:59:06.759854Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

source=pdf_text observed=2026-08-10T21:59:06.725186Z digest=sha256:bade02145bb25892f5202ff50ec0dd3cdec6eee3139f76d497ee93f204f51d68

Pith citing papers

No inbound Pith citation observations are available.