Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T11:47:43.510277Z
Paper Citation Record · LEDGER
High-throughput fabrication and semi-automated characterization of oxide thin film transistors
As of 16 August 2026, this Paper Citation Record lists 2 of 2 outbound references and 0 inbound Pith citation observations for arXiv:1908.08287.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
2 of 2 outbound references displayed
- verified exact0
- verified fuzzy1
- unresolved1
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 9a5c4d34-fd2a-4e9e-9f65-9ea1d53c15e5 · outbound
This paper cites an unresolved cited work.
High-throughput fabrication and semi-automated characterization of oxide thin film transistors Unresolved cited work
Reference 1
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T11:47:43.567781Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.
Observation f580f200-a0ca-4337-8895-4db2833a1ca5 · outbound
This paper cites probe stage.
High-throughput fabrication and semi-automated characterization of oxide thin film transistors probe stage
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T11:47:43.550446Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.
Pith citing papers
No inbound Pith citation observations are available.