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Integrity report for Barrier-channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:2606.04842 · pith:2026:V5BVM45PQKNSRXNJF3C2GWTJCM

0Critical
0Advisory
4Detectors run
2026-06-05Last checked

Paper page arXiv integrity.json bundle.json

Detector runs

claim_evidence completed v1.0.0 · findings 0 · 2026-06-05 03:29:14.104086+00:00
citation_quote_validity skipped v0.1.0 · findings 0 · 2026-06-04 09:51:06.744810+00:00
cited_work_retraction completed v1.0.0 · findings 0 · 2026-06-04 06:27:21.341074+00:00
ai_meta_artifact skipped v1.0.0 · findings 0 · 2026-06-04 01:35:37.399226+00:00

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/V5BVM45P/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.