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Integrity report for The Deposition of High-Quality HfO2 on Graphene and the Effect of Remote Oxide Phonon Scattering

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:0912.1378 · pith:2009:V5W6GKYBNPNJVYCWR54JBUE4O3

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Paper page arXiv integrity.json bundle.json

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Signed record

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