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Paper Citation Record · LEDGER

Assessment of error variation in high-fidelity two-qubit gates in silicon

As of 17 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 3 inbound Pith citation observations for arXiv:2303.04090.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2303.04090 v3

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 3 of 3 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00

measured 3 of 3 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-06T18:18:45.865364Z

measured 1 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-08-05T02:28:24.338817Z

Reference resolution

0 of 0 outbound references displayed

  • verified exact0
  • verified fuzzy0
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

9
arxiv_reference, observed 2026-08-05T02:28:24.338817Z

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation d268e22d-fa92-498f-9a36-4729f400c7bc · inbound

CMOS compatibility of semiconductor spin qubits cites this paper.

CMOS compatibility of semiconductor spin qubits Assessment of error variation in high-fidelity two-qubit gates in silicon

Reference 33

Resolution
verified exact
arxiv_id, observed 2026-05-23T21:13:26.475015Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

source=pdf_text observed=2026-05-23T21:12:52.044490Z digest=sha256:8e0f176a1911754650b03f28854b43362578f1b05535d17f700fde1de3e7eb99

Observation eac8eba4-47c9-4837-b256-56accfd8eebc · inbound

Simulated non-Markovian Noise Resilience of Silicon-Based Spin Qubits with Surface Code Error Correction cites this paper.

Simulated non-Markovian Noise Resilience of Silicon-Based Spin Qubits with Surface Code Error Correction Assessment of error variation in high-fidelity two-qubit gates in silicon

Reference 44

Resolution
unresolved
no resolver link, observed 2026-08-06T18:18:45.865364Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-06T18:18:45.865364Z digest=sha256:7295a8cf58ec9312f2b871b66c8c888a60cfb7acd411042ad6cc803000ed26e4

Observation 9c50a953-8efb-46cd-9055-6c4088713684 · inbound

Smooth velocity shuttling for suppressing valley excitations in disordered Si/SiGe quantum dots cites this paper.

Smooth velocity shuttling for suppressing valley excitations in disordered Si/SiGe quantum dots Assessment of error variation in high-fidelity two-qubit gates in silicon

Reference 27

Resolution
verified exact
arxiv_id, observed 2026-07-01T23:06:20.066498Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.

source=pdf_text observed=2026-06-28T14:43:34.367055Z digest=sha256:7633f1bfee458c01013c7d0cd1b77723df073d1189825daeeabade831d5a498b