Paper Citation Record · LEDGER

Visualization of Defect Electronic States in Layered Semiconductor CrSBr

As of 13 August 2026, this Paper Citation Record lists 11 of 11 outbound references and 0 inbound Pith citation observations for arXiv:2607.21301.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.21301 v1

Coverage vector

measured 11 of 11 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-01T07:54:28.196205Z

measured 11 of 11 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-12T06:34:41.77262+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

11 of 11 outbound references displayed

verified exact8
verified fuzzy0
unresolved3
parse uncertain0
malformed identifier0
metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 0b8f1115-592b-45e3-bf9f-a3d01e5a8dde · outbound

This paper cites Defect Engineering in 2D Materials: Precise Manipulation and Improved Functionalities.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr Defect Engineering in 2D Materials: Precise Manipulation and Improved Functionalities

Reference 1

Resolution: unresolved; no resolver link, observed 2026-08-01T07:54:27.135616Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4f774d96-e9f8-4441-9e2d-a657ed2fa020 · outbound

This paper cites M.; Luican-Mayer, A.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr M.; Luican-Mayer, A

Reference 9

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.284585Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 49e75d27-6152-4da6-b551-c8a8d192e26c · outbound

This paper cites (29) Defects in Two-Dimensional Materials, 1st ed.; Addou, R., Colombo, L., Eds.; Materials Today; Elsevier: Amsterdam, Netherlands,.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (29) Defects in Two-Dimensional Materials, 1st ed.; Addou, R., Colombo, L., Eds.; Materials Today; Elsevier: Amsterdam, Netherlands,

Reference 54

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.042990Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 321e8205-6dfb-43b9-a1c5-68d757042b88 · outbound

This paper cites (33) Perdew, J.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (33) Perdew, J

Reference 106

Resolution: verified exact; doi, observed 2026-08-01T07:58:24.837749Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 527eb2f9-5325-434b-a809-175e4b19f72e · outbound

This paper cites (6) Tang, K.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (6) Tang, K

Reference 410

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.342514Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation cf6ec397-19af-4174-b4eb-f420dc1fef0c · outbound

This paper cites (15) Feuer, M.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (15) Feuer, M

Reference 1853

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.219205Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 3ab9331d-b720-44de-ad24-dd14358d8ac2 · outbound

This paper cites (2) Tongay, S.; Suh, J.; Ataca, C.; Fan, W.; Luce, A.; Kang, J.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (2) Tongay, S.; Suh, J.; Ataca, C.; Fan, W.; Luce, A.; Kang, J

Reference 2019

Resolution: unresolved; no resolver link, observed 2026-08-01T07:54:27.174194Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 4d58c581-fd2e-4a10-8a97-7cd89ab60c60 · outbound

This paper cites A.; Lee, J.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr A.; Lee, J

Reference 2022

Resolution: unresolved; no resolver link, observed 2026-08-01T07:54:27.878228Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation aac9d471-90f1-46c5-add7-829b0851f30d · outbound

This paper cites Über Chalkogenidhalogenide Des Chroms Synthese, Kristallstruktur Und Magnetismus von Chromsulfidbromid, CrSBr.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr Über Chalkogenidhalogenide Des Chroms Synthese, Kristallstruktur Und Magnetismus von Chromsulfidbromid, CrSBr

Reference 2026

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.154257Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 73db8460-140e-4db5-8f89-6de8ac239466 · outbound

This paper cites (3) Greben, K.; Arora, S.; Harats, M.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr (3) Greben, K.; Arora, S.; Harats, M

Reference 2657

Resolution: verified exact; doi, observed 2026-08-01T07:58:25.434003Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Observation 841fa796-58dc-47a4-89a8-1d623850dad4 · outbound

This paper cites 21 (31) Nguyen, G.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr 21 (31) Nguyen, G

Reference 7287

Resolution: verified exact; doi, observed 2026-08-01T07:58:24.946526Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-12T06:34:41.77262+00:00.

Pith citing papers

No inbound Pith citation observations are available.