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Integrity report for Initial growth behavior and resulting microstructural properties of heteroepitaxial ZnO thin films on sapphire (0001) substrates

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:cond-mat/0608495 · pith:2006:XPA5YVDUROM6V2OSYTRNKTLADO

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Paper page arXiv integrity.json bundle.json

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Signed record

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