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Integrity report for Selective-Area Epitaxy of Bulk-Insulating (Bi_xSb_(1-x))₂Te₃ Films and Nanowires by Molecular Beam Epitaxy

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arXiv:2404.08427 · pith:2024:YS7KRJWCTED43BB6L6V3N4LL6Q

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Paper page arXiv integrity.json bundle.json

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Signed record

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