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Integrity report for Reduction of residual stress in AlN thin Films synthesized by magnetron sputtering technique

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1507.08113 · pith:2015:YVDYB6JA6GLSL4SEW3HKJ3DB2V

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Paper page arXiv integrity.json bundle.json

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Signed record

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