Integrity report for Atomic origin of high temperature electron trapping in MOS devices

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1503.03602 · pith:2015:Z3AIYH4MMJKM2C7XYWWH7BDZTZ

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0Advisory

0Detectors run

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Paper page arXiv integrity.json bundle.json

Detector runs

Findings

No public integrity findings for this paper.

Signed record

The machine-readable record for this paper lives at /pith/Z3AIYH4MMJKM2C7XYWWH7BDZTZ/integrity.json. Pith Number bundles also include signed pith.integrity.v1 events where a Pith Number exists.