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Integrity report for Unconventional Localization Prior to Wrinkles and Controllable Surface Patterns of Film Substrate Bilayers Through Patterned Defects in Substrate

A machine-verified record of the checks Pith has run against this paper: detector runs, findings, signed bundle events, and canonical identifiers.

arXiv:1703.10078 · pith:2017:Z5AJFNE3AXBU5XRUXC6Z3WMMXP

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Paper page arXiv integrity.json bundle.json

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Signed record

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