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X-ray scattering study of two length scales in the critical fluctuations of CuGeO3

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arxiv cond-mat/0004363 v1 pith:AELR5F45 submitted 2000-04-20 cond-mat.str-el

Y.J. Wang , Y.-J. Kim , R.J. Christianson , S.C. LaMarra , F.C. Chou , R.J. Birgeneau This is my paper
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keywords lengthfluctuationsscalesalongaxiscriticalscatteringsurface
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abstract

The critical fluctuations of CuGeO$_3$ have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the $a$ axis, with the $a$ axis along the surface normal direction. We believe that such a directional preference is a clear sign that surface random strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.

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