Pith. sign in

REVIEW

Inelastic X-Ray Scattering Study of Exciton Properties in an Organic Molecular crystal

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv cond-mat/0607805 v2 pith:7VOSLBTN submitted 2006-07-31 cond-mat.other

classification cond-mat.other
keywords excitoncomplexmolecularorganiccrystaldielectricdynamicexcitons
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

Excitons in a complex organic molecular crystal were studied by inelastic x-ray scattering (IXS) for the first time. The dynamic dielectric response function is measured over a large momentum transfer region, from which an exciton dispersion of 130 meV is observed. Semiempirical quantum chemical calculations reproduce well the momentum dependence of the measured dynamic dielectric responses, and thus unambiguously indicate that the lowest Frenkel exciton is confined within a fraction of the complex molecule. Our results demonstrate that IXS is a powerful tool for studying excitons in complex organic molecular systems. Besides the energy position, the IXS spectra provide a stringent test on the validity of the theoretically calculated exciton wave functions.

Discussion (0). Sign in to comment.

Pith tools